fbpx
Select Page

Instruments for Advanced Science

RGA gauges together with shadow

Residual Gas Analysis

Systems for real time concentration of gases and vapours in in UHV real time.

Surface Analysis

Systems for chemical characterisation of surfaces and depth profiling, for layer structure identification & surface contamination studies.

Plasma Characterisation

Fully characterise plasmas for sputtering and deposition applications.

Knowledge, Experience, Expertise

Send us a message to find out more about our range of products. 

Contact Us

+44(0) 1925 445225